Validation of a symbol response memory

ABSTRACT

Configuration content of electronic devices used for data analysis may be altered due to bit failure or corruption, for example. Accordingly, in one embodiment, a device includes a plurality of blocks, each block of the plurality of blocks includes a plurality of rows, each row of the plurality of rows includes a plurality of configurable elements, each configurable element of the plurality of configurable elements includes a data analysis element including a memory component programmed with configuration data. The data analysis element is configured to analyze at least a portion of a data stream based on the configuration data and to output a result of the analysis. The device also includes an error detection engine (EDE) configured to perform integrity validation of the configuration data.

BACKGROUND Field of Invention

Embodiments of the invention relate generally to electronic devices and,more specifically, in certain embodiments, to validation ofconfiguration content stored in electronic devices used for dataanalysis.

Description of Related Art

Complex pattern recognition can be inefficient to perform on aconventional von Neumann based computer. A biological brain, inparticular a human brain, however, is adept at performing patternrecognition. Current research suggests that a human brain performspattern recognition using a series of hierarchically organized neuronlayers in the neocortex. Neurons in the lower layers of the hierarchyanalyze “raw signals” from, for example, sensory organs, while neuronsin higher layers analyze signal outputs from neurons in the lowerlevels. This hierarchical system in the neocortex, possibly incombination with other areas of the brain, accomplishes the complexpattern recognition that enables humans to perform high level functionssuch as spatial reasoning, conscious thought, and complex language.

In the field of computing, pattern recognition tasks are increasinglychallenging. Ever larger volumes of data are transmitted betweencomputers, and the number of patterns that users wish to identify isincreasing. For example, spam or malware are often detected by searchingfor patterns in a data stream, e.g., particular phrases or pieces ofcode. The number of patterns increases with the variety of spam andmalware, as new patterns may be implemented to search for new variants.Searching a data stream for each of these patterns can form a computingbottleneck. Often, as the data stream is received, it is searched foreach pattern, one at a time. The delay before the system is ready tosearch the next portion of the data stream increases with the number ofpatterns. Thus, pattern recognition may slow the receipt of data.

Hardware has been designed to search a data stream for patterns, butthis hardware often is unable to process adequate amounts of data in anamount of time given. Some devices configured to search a data stream doso by distributing the data stream among a plurality of circuits. Thecircuits each determine whether the data stream matches a portion of apattern. Often, a large number of circuits operate in parallel, eachsearching the data stream at generally the same time. The system maythen further process the results from these circuits, to arrive at thefinal results. These “intermediate results”, however, can be larger thanthe original input data, which may pose issues for the system. Theability to use a cascaded circuits approach, similar to the human brain,offers one potential solution to this problem. However, there has notbeen a system that effectively allows for performing pattern recognitionin a manner more comparable to that of a biological brain. In addition,configuration content of electronic devices used for data analysis insome systems may be altered due to bit failure or corruption.Development of a system that performs pattern recognition comparable tothe biological brain and that validates configuration content isdesirable.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 illustrates an example of system having a state machine engine,according to various embodiments;

FIG. 2 illustrates an example of an FSM lattice of the state machineengine of FIG. 1, according to various embodiments;

FIG. 3 illustrates an example of a block of the FSM lattice of FIG. 2,according to various embodiments;

FIG. 4 illustrates an example of a row of the block of FIG. 3, accordingto various embodiments;

FIG. 4A illustrates a block as in FIG. 3 having counters in rows of theblock, according to various embodiments of the invention;

FIG. 5 illustrates an example of a Group of Two of the row of FIG. 4,according to embodiments;

FIG. 6 illustrates an example of a finite state machine graph, accordingto various embodiments;

FIG. 7 illustrates an example of two-level hierarchy implemented withFSM lattices, according to various embodiments;

FIG. 7A illustrates a second example of two-level hierarchy implementedwith FSM lattices, according to various embodiments;

FIG. 8 illustrates an example of a method for a compiler to convertsource code into a binary file for programming of the FSM lattice ofFIG. 2, according to various embodiments;

FIG. 9 illustrates a state machine engine, according to variousembodiments;

FIG. 10 illustrates a second example of an FSM lattice of the statemachine engine of FIG. 1 including an error detection engine (EDE),according to various embodiments;

FIG. 11 illustrates example components of the EDE, according to variousembodiments;

FIG. 12 illustrates anexample of a Group of Two of a row of a block ofFIG. 4 including Symbol Response Memory, according to embodiments;

FIG. 13 illustrates a second example of a state machine engine includingan error detection engine (EDE), according to various embodiments; and

FIG. 14 illustrates a flow chart of a method for validating theconfiguration contents of the Symbol Response Memory, according tovarious embodiments.

DETAILED DESCRIPTION

Turning now to the figures, FIG. 1 illustrates an embodiment of aprocessor-based system, generally designated by reference numeral 10.The system 10 may be any of a variety of types such as a desktopcomputer, laptop computer, pager, cellular phone, personal organizer,portable audio player, control circuit, camera, etc. The system 10 mayalso be a network node, such as a router, a server, or a client (e.g.,one of the previously-described types of computers). The system 10 maybe some other sort of electronic device, such as a copier, a scanner, aprinter, a game console, a television, a set-top video distribution orrecording system, a cable box, a personal digital media player, afactory automation system, an automotive computer system, or a medicaldevice. (The terms used to describe these various examples of systems,like many of the other terms used herein, may share some referents and,as such, should not be construed narrowly in virtue of the other itemslisted.)

In a typical processor-based device, such as the system 10, a processor12, such as a microprocessor, controls the processing of systemfunctions and requests in the system 10. Further, the processor 12 maycomprise a plurality of processors that share system control. Theprocessor 12 may be coupled directly or indirectly to each of theelements in the system 10, such that the processor 12 controls thesystem 10 by executing instructions that may be stored within the system10 or external to the system 10.

In accordance with the embodiments described herein, the system 10includes a state machine engine 14, which may operate under control ofthe processor 12. The state machine engine 14 may employ any one of anumber of state machine architectures, including, but not limited toMealy architectures, Moore architectures, Finite State Machines (FSMs),Deterministic FSMs (DFSMs), Bit-Parallel State Machines (BPSMs), etc.Though a variety of architectures may be used, for discussion purposes,the application refers to FSMs. However, those skilled in the art willappreciate that the described techniques may be employed using any oneof a variety of state machine architectures.

As discussed further below, the state machine engine 14 may include anumber of (e.g., one or more) finite state machine (FSM) lattices (e.g.,core of a chip). For purposes of this application the term “lattice”refers to an organized framework (e.g., routing matrix, routing network,frame) of elements (e.g., Boolean cells, counter cells, state machineelements, state transition elements). Furthermore, the “lattice” mayhave any suitable shape, structure, or hierarchical organization (e.g.,grid, cube, spherical, cascading). Each FSM lattice may implementmultiple FSMs that each receive and analyze the same data in parallel.Further, the FSM lattices may be arranged in groups (e.g., clusters),such that clusters of FSM lattices may analyze the same input data inparallel. Further, clusters of FSM lattices of the state machine engine14 may be arranged in a hierarchical structure wherein outputs fromstate machine lattices on a lower level of the hierarchical structuremay be used as inputs to state machine lattices on a higher level. Bycascading clusters of parallel FSM lattices of the state machine engine14 in series through the hierarchical structure, increasingly complexpatterns may be analyzed (e.g., evaluated, searched, etc.).

Further, based on the hierarchical parallel configuration of the statemachine engine 14, the state machine engine 14 can be employed forcomplex data analysis (e.g., pattern recognition or other processing) insystems that utilize high processing speeds. For instance, embodimentsdescribed herein may be incorporated in systems with processing speedsof 1 GByte/sec. Accordingly, utilizing the state machine engine 14, datafrom high speed memory devices or other external devices may be rapidlyanalyzed. The state machine engine 14 may analyze a data streamaccording to several criteria (e.g., search terms), at about the sametime, e.g., during a single device cycle. Each of the FSM latticeswithin a cluster of FSMs on a level of the state machine engine 14 mayeach receive the same search term from the data stream at about the sametime, and each of the parallel FSM lattices may determine whether theterm advances the state machine engine 14 to the next state in theprocessing criterion. The state machine engine 14 may analyze termsaccording to a relatively large number of criteria, e.g., more than 100,more than 110, or more than 10,000. Because they operate in parallel,they may apply the criteria to a data stream having a relatively highbandwidth, e.g., a data stream of greater than or generally equal to 1GByte/sec, without slowing the data stream.

In one embodiment, the state machine engine 14 may be configured torecognize (e.g., detect) a great number of patterns in a data stream.For instance, the state machine engine 14 may be utilized to detect apattern in one or more of a variety of types of data streams that a useror other entity might wish to analyze. For example, the state machineengine 14 may be configured to analyze a stream of data received over anetwork, such as packets received over the Internet or voice or datareceived over a cellular network. In one example, the state machineengine 14 may be configured to analyze a data stream for spam ormalware. The data stream may be received as a serial data stream, inwhich the data is received in an order that has meaning, such as in atemporally, lexically, or semantically significant order. Alternatively,the data stream may be received in parallel or out of order and, then,converted into a serial data stream, e.g., by reordering packetsreceived over the Internet. In some embodiments, the data stream maypresent terms serially, but the bits expressing each of the terms may bereceived in parallel. The data stream may be received from a sourceexternal to the system 10, or may be formed by interrogating a memorydevice, such as the memory 16, and forming the data stream from datastored in the memory 16. In other examples, the state machine engine 14may be configured to recognize a sequence of characters that spell acertain word, a sequence of genetic base pairs that specify a gene, asequence of bits in a picture or video file that form a portion of animage, a sequence of bits in an executable file that form a part of aprogram, or a sequence of bits in an audio file that form a part of asong or a spoken phrase. The stream of data to be analyzed may includemultiple bits of data in a binary format or other formats, e.g., baseten, ASCII, etc. The stream may encode the data with a single digit ormultiple digits, e.g., several binary digits.

As will be appreciated, the system 10 may include memory 16. The memory16 may include volatile memory, such as Dynamic Random Access Memory(DRAM), Static Random Access Memory (SRAM), Synchronous DRAM (SDRAM),Double Data Rate DRAM (DDR SDRAM), DDR2 SDRAM, DDR3 SDRAM, etc. Thememory 16 may also include non-volatile memory, such as read-only memory(ROM), PC-RAM, silicon-oxide-nitride-oxide-silicon (SONOS) memory,metal-oxide-nitride-oxide-silicon (MONOS) memory, polysilicon floatinggate based memory, and/or other types of flash memory of variousarchitectures (e.g., NAND memory, NOR memory, etc.) to be used inconjunction with the volatile memory. The memory 16 may include one ormore memory devices, such as DRAM devices, that may provide data to beanalyzed by the state machine engine 14. As used herein, the term“provide” may generically refer to direct, input, insert, issue, route,send, transfer, transmit, generate, give, make available, move, output,pass, place, read out, write, etc. Such devices may be referred to as orinclude solid state drives (SSD's), MultiMediaCards (MMC's),SecureDigital (SD) cards, CompactFlash (CF) cards, or any other suitabledevice. Further, it should be appreciated that such devices may coupleto the system 10 via any suitable interface, such as Universal SerialBus (USB), Peripheral Component Interconnect (PCI), PCI Express (PCI-E),Small Computer System Interface (SCSI), IEEE 1394 (Firewire), or anyother suitable interface. To facilitate operation of the memory 16, suchas the flash memory devices, the system 10 may include a memorycontroller (not illustrated). As will be appreciated, the memorycontroller may be an independent device or it may be integral with theprocessor 12. Additionally, the system 10 may include an externalstorage 18, such as a magnetic storage device. The external storage mayalso provide input data to the state machine engine 14.

The system 10 may include a number of additional elements. For instance,a compiler 20 may be used to configure (e.g., program) the state machineengine 14, as described in more detail with regard to FIG. 8. An inputdevice 22 may also be coupled to the processor 12 to allow a user toinput data into the system 10. For instance, an input device 22 may beused to input data into the memory 16 for later analysis by the statemachine engine 14. The input device 22 may include buttons, switchingelements, a keyboard, a light pen, a stylus, a mouse, and/or a voicerecognition system, for instance. An output device 24, such as a displaymay also be coupled to the processor 12. The display 24 may include anLCD, a CRT, LEDs, and/or an audio display, for example. They system mayalso include a network interface device 26, such as a Network InterfaceCard (NIC), for interfacing with a network, such as the Internet. Aswill be appreciated, the system 10 may include many other components,depending on the application of the system 10.

FIGS. 2-5 illustrate an example of a FSM lattice 30. In an example, theFSM lattice 30 comprises an array of blocks 32. As will be described,each block 32 may include a plurality of selectively couple-ablehardware elements (e.g., configurable elements and/or special purposeelements) that correspond to a plurality of states in a FSM. Similar toa state in a FSM, a hardware element can analyze an input stream andactivate a downstream hardware element, based on the input stream.

The configurable elements can be configured (e.g., programmed) toimplement many different functions. For instance, the configurableelements may include state transition elements (STEs) 34, 36 (shown inFIG. 5) that function as data analysis elements and are hierarchicallyorganized into rows 38 (shown in FIGS. 3 and 4) and blocks 32 (shown inFIGS. 2 and 3). The STEs each may be considered an automaton, e.g., amachine or control mechanism designed to follow automatically apredetermined sequence of operations or respond to encoded instructions.Taken together, the STEs form an automata processor as state machineengine 14. To route signals between the hierarchically organized STEs34, 36, a hierarchy of configurable switching elements can be used,including inter-block switching elements 40 (shown in FIGS. 2 and 3),intra-block switching elements 42 (shown in FIGS. 3 and 4) and intra-rowswitching elements 44 (shown in FIG. 4).

As described below, the switching elements may include routingstructures and buffers. A STE 34, 36 can correspond to a state of a FSMimplemented by the FSM lattice 30. The STEs 34, 36 can be coupledtogether by using the configurable switching elements as describedbelow. Accordingly, a FSM can be implemented on the FSM lattice 30 byconfiguring the STEs 34, 36 to correspond to the functions of states andby selectively coupling together the STEs 34, 36 to correspond to thetransitions between states in the FSM.

FIG. 2 illustrates an overall view of an example of a FSM lattice 30.The FSM lattice 30 includes a plurality of blocks 32 that can beselectively coupled together with configurable inter-block switchingelements 40. The inter-block switching elements 40 may includeconductors 46 (e.g., wires, traces, etc.) and buffers 48, 50. In anexample, buffers 48 and 50 are included to control the connection andtiming of signals to/from the inter-block switching elements 40. Asdescribed further below, the buffers 48 may be provided to buffer databeing sent between blocks 32, while the buffers 50 may be provided tobuffer data being sent between inter-block switching elements 40.Additionally, the blocks 32 can be selectively coupled to an input block52 (e.g., a data input port) for receiving signals (e.g., data) andproviding the data to the blocks 32. The blocks 32 can also beselectively coupled to an output block 54 (e.g., an output port) forproviding signals from the blocks 32 to an external device (e.g.,another FSM lattice 30). The FSM lattice 30 can also include aprogramming interface 56 to configure (e.g., via an image, program) theFSM lattice 30. The image can configure (e.g., set) the state of theSTEs 34, 36. For example, the image can configure the STEs 34, 36 toreact in a certain way to a given input at the input block 52. Forexample, a STE 34, 36 can be set to output a high signal when thecharacter ‘a’ is received at the input block 52.

In an example, the input block 52, the output block 54, and/or theprogramming interface 56 can be implemented as registers such thatwriting to or reading from the registers provides data to or from therespective elements. Accordingly, bits from the image stored in theregisters corresponding to the programming interface 56 can be loaded onthe STEs 34, 36. Although FIG. 2 illustrates a certain number ofconductors (e.g., wire, trace) between a block 32, input block 52,output block 54, and an inter-block switching element 40, it should beunderstood that in other examples, fewer or more conductors may be used.

FIG. 3 illustrates an example of a block 32. A block 32 can include aplurality of rows 38 that can be selectively coupled together withconfigurable intra-block switching elements 42. Additionally, a row 38can be selectively coupled to another row 38 within another block 32with the inter-block switching elements 40. A row 38 includes aplurality of STEs 34, 36 organized into pairs of configurable elementsthat are referred to herein as groups of two (GOTs) 60. In an example, ablock 32 comprises sixteen (16) rows 38.

FIG. 4 illustrates an example of a row 38. A GOT 60 can be selectivelycoupled to other GOTs 60 and any other elements (e.g., a special purposeelement 58) within the row 38 by configurable intra-row switchingelements 44. A GOT 60 can also be coupled to other GOTs 60 in other rows38 with the intra-block switching element 42, or other GOTs 60 in otherblocks 32 with an inter-block switching element 40. In an example, a GOT60 has a first and second input 62, 64, and an output 66. The firstinput 62 is coupled to a first STE 34 of the GOT 60 and the second input64 is coupled to a second STE 36 of the GOT 60, as will be furtherillustrated with reference to FIG. 5.

In an example, the row 38 includes a first and second plurality of rowinterconnection conductors 68, 70. In an example, an input 62, 64 of aGOT 60 can be coupled to one or more row interconnection conductors 68,70, and an output 66 can be coupled to one or more row interconnectionconductor 68, 70. In an example, a first plurality of the rowinterconnection conductors 68 can be coupled to each STE 34, 36 of eachGOT 60 within the row 38. A second plurality of the row interconnectionconductors 70 can be coupled to only one STE 34, 36 of each GOT 60within the row 38, but cannot be coupled to the other STE 34, 36 of theGOT 60. In an example, a first half of the second plurality of rowinterconnection conductors 70 can couple to first half of the STEs 34,36 within a row 38 (one STE 34 from each GOT 60) and a second half ofthe second plurality of row interconnection conductors 70 can couple toa second half of the STEs 34, 36 within a row 38 (the other STE 34, 36from each GOT 60), as will be better illustrated with respect to FIG. 5.The limited connectivity between the second plurality of rowinterconnection conductors 70 and the STEs 34, 36 is referred to hereinas “parity”. In an example, the row 38 can also include a specialpurpose element 58 such as a counter, a configurable Boolean logicelement, look-up table, RAM, a field configurable gate array (FPGA), anapplication specific integrated circuit (ASIC), a configurable processor(e.g., a microprocessor), or other element for performing a specialpurpose function.

In an example, the special purpose element 58 comprises a counter (alsoreferred to herein as counter 58). In an example, the counter 58comprises a 12-bit configurable down counter. The 12-bit configurablecounter 58 has a counting input, a reset input, and zero-count output.The counting input, when asserted, decrements the value of the counter58 by one. The reset input, when asserted, causes the counter 58 to loadan initial value from an associated register. For the 12-bit counter 58,up to a 12-bit number can be loaded in as the initial value. When thevalue of the counter 58 is decremented to zero (0), the zero-countoutput is asserted. The counter 58 also has at least two modes, pulseand hold. When the counter 58 is set to pulse mode, the zero-countoutput is asserted when the counter 58 reaches zero. For example, thezero-count output is asserted during the processing of an immediatelysubsequent next data byte, which results in the counter 58 being offsetin time with respect to the input character cycle. After the nextcharacter cycle, the zero-count output is no longer asserted. In thismanner, for example, in the pulse mode, the zero-count output isasserted for one input character processing cycle. When the counter 58is set to hold mode the zero-count output is asserted during the clockcycle when the counter 58 decrements to zero, and stays asserted untilthe counter 58 is reset by the reset input being asserted.

In another example, the special purpose element 58 comprises Booleanlogic. For example, the Boolean logic may be used to perform logicalfunctions, such as AND, OR, NAND, NOR, Sum of Products (SoP),Negated-Output Sum of Products (NSoP), Negated-Output Product of Sum(NPoS), and Product of Sums (PoS) functions. This Boolean logic can beused to extract data from terminal state STEs (corresponding to terminalnodes of a FSM, as discussed later herein) in FSM lattice 30. The dataextracted can be used to provide state data to other FSM lattices 30and/or to provide configuring data used to reconfigure FSM lattice 30,or to reconfigure another FSM lattice 30.

FIG. 4A is an illustration of an example of a block 32 having rows 38which each include the special purpose element 58. For example, thespecial purpose elements 58 in the block 32 may include counter cells58A and Boolean logic cells 58B. While only the rows 38 in row positions0 through 4 are illustrated in FIG. 4A (e.g., labeled 38A through 38E),each block 32 may have any number of rows 38 (e.g., 16 rows 38), and oneor more special purpose elements 58 may be configured in each of therows 38. For example, in one embodiment, counter cells 58A may beconfigured in certain rows 38 (e.g., in row positions 0, 4, 8, and 12),while the Boolean logic cells 58B may be configured in the remaining ofthe 16 rows 38 (e.g., in row positions 1, 2, 3, 5, 6, 7, 9, 10, 11, 13,14, 15, and 16). The GOT 60 and the special purpose elements 58 may beselectively coupled (e.g., selectively connected) in each row 38 throughintra-row switching elements 44, where each row 38 of the block 32 maybe selectively coupled with any of the other rows 38 of the block 32through intra-block switching elements 42.

In some embodiments, each active GOT 60 in each row 38 may output asignal indicating whether one or more conditions are detected (e.g., asearch result is detected), and the special purpose element 58 in therow 38 may receive the GOT 60 output to determine whether certainquantifiers of the one or more conditions are met and/or count a numberof times a condition is detected. For example, quantifiers of a countoperation may include determining whether a condition was detected atleast a certain number of times, determining whether a condition wasdetected no more than a certain number of times, determining whether acondition was detected exactly a certain number of times, anddetermining whether a condition was detected within a certain range oftimes.

Outputs from the counter 58A and/or the Boolean logic cell 58B may becommunicated through the intra-row switching elements 44 and theintra-block switching elements 42 to perform counting or logic withgreater complexity. For example, counters 58A may be configured toimplement the quantifiers, such as asserting an output only when acondition is detected an exact number of times. Counters 58A in a block32 may also be used concurrently, thereby increasing the total bit countof the combined counters to count higher numbers of a detectedcondition. Furthermore, in some embodiments, different special purposeelements 58 such as counters 58A and Boolean logic cells 58B may be usedtogether. For example, an output of one or more Boolean logic cells 58Bmay be counted by one or more counters 58A in a block 32.

FIG. 5 illustrates an example of a GOT 60. The GOT 60 includes a firstSTE 34, a second STE 36, and intra-group circuitry 37 coupled to thefirst STE 34 and the second STE 36. For example, the first STE 34 andthe second STE 36 may have inputs 62, 64 and outputs 72, 74 coupled toan OR gate 76 and a 3-to-1 multiplexer 78 of the intra-group circuitry37. The 3-to-1 multiplexer 78 can be set to couple the output 66 of theGOT 60 to either the first STE 34, the second STE 36, or the OR gate 76.The OR gate 76 can be used to couple together both outputs 72, 74 toform the common output 66 of the GOT 60. In an example, the first andsecond STE 34, 36 exhibit parity, as discussed above, where the input 62of the first STE 34 can be coupled to some of the row interconnectionconductors 68 and the input 64 of the second STE 36 can be coupled toother row interconnection conductors 70 the common output 66 may beproduced which may overcome parity problems. In an example, the two STEs34, 36 within a GOT 60 can be cascaded and/or looped back to themselvesby setting either or both of switching elements 79. The STEs 34, 36 canbe cascaded by coupling the output 72, 74 of the STEs 34, 36 to theinput 62, 64 of the other STE 34, 36. The STEs 34, 36 can be looped backto themselves by coupling the output 72, 74 to their own input 62, 64.Accordingly, the output 72 of the first STE 34 can be coupled toneither, one, or both of the input 62 of the first STE 34 and the input64 of the second STE 36. Additionally, as each of the inputs 62, 64 maybe coupled to a plurality of row routing lines, an OR gate may beutilized to select any of the inputs from these row routing lines alonginputs 62, 64, as well as the outputs 72, 74.

In an example, each state transition element 34, 36 comprises aplurality of memory cells 80, such as those often used in dynamic randomaccess memory (DRAM), coupled in parallel to a detect line 82. One suchmemory cell 80 comprises a memory cell that can be set to a data state,such as one that corresponds to either a high or a low value (e.g., a 1or 0). The output of the memory cell 80 is coupled to the detect line 82and the input to the memory cell 80 receives signals based on data onthe data stream line 84. In an example, an input at the input block 52is decoded to select one or more of the memory cells 80. The selectedmemory cell 80 provides its stored data state as an output onto thedetect line 82. For example, the data received at the input block 52 canbe provided to a decoder (not shown) and the decoder can select one ormore of the data stream lines 84. In an example, the decoder can convertan 8-bit ACSII character to the corresponding 1 of 256 data stream lines84.

A memory cell 80, therefore, outputs a high signal to the detect line 82when the memory cell 80 is set to a high value and the data on the datastream line 84 selects the memory cell 80. When the data on the datastream line 84 selects the memory cell 80 and the memory cell 80 is setto a low value, the memory cell 80 outputs a low signal to the detectline 82. The outputs from the memory cells 80 on the detect line 82 aresensed by a detection cell 86.

In an example, the signal on an input line 62, 64 sets the respectivedetection cell 86 to either an active or inactive state. When set to theinactive state, the detection cell 86 outputs a low signal on therespective output 72, 74 regardless of the signal on the respectivedetect line 82. When set to an active state, the detection cell 86outputs a high signal on the respective output line 72, 74 when a highsignal is detected from one of the memory cells 80 of the respective STE34, 36. When in the active state, the detection cell 86 outputs a lowsignal on the respective output line 72, 74 when the signals from all ofthe memory cells 82 of the respective STE 34, 36 are low.

In an example, an STE 34, 36 includes 256 memory cells 80 and eachmemory cell 80 is coupled to a different data stream line 84. Thus, anSTE 34, 36 can be programmed to output a high signal when a selected oneor more of the data stream lines 84 have a high signal thereon. Forexample, the STE 34 can have a first memory cell 80 (e.g., bit 0) sethigh and all other memory cells 80 (e.g., bits 1-255) set low. When therespective detection cell 86 is in the active state, the STE 34 outputsa high signal on the output 72 when the data stream line 84corresponding to bit 0 has a high signal thereon. In other examples, theSTE 34 can be set to output a high signal when one of multiple datastream lines 84 have a high signal thereon by setting the appropriatememory cells 80 to a high value.

In an example, a memory cell 80 can be set to a high or low value byreading bits from an associated register. Accordingly, the STEs 34 canbe configured by storing an image created by the compiler 20 into theregisters and loading the bits in the registers into associated memorycells 80. In an example, the image created by the compiler 20 includes abinary image of high and low (e.g., 1 and 0) bits. The image canconfigure the FSM lattice 30 to implement a FSM by cascading the STEs34, 36. For example, a first STE 34 can be set to an active state bysetting the detection cell 86 to the active state. The first STE 34 canbe set to output a high signal when the data stream line 84corresponding to bit 0 has a high signal thereon. The second STE 36 canbe initially set to an inactive state, but can be set to, when active,output a high signal when the data stream line 84 corresponding to bit 1has a high signal thereon. The first STE 34 and the second STE 36 can becascaded by setting the output 72 of the first STE 34 to couple to theinput 64 of the second STE 36. Thus, when a high signal is sensed on thedata stream line 84 corresponding to bit 0, the first STE 34 outputs ahigh signal on the output 72 and sets the detection cell 86 of thesecond STE 36 to an active state. When a high signal is sensed on thedata stream line 84 corresponding to bit 1, the second STE 36 outputs ahigh signal on the output 74 to activate another STE 36 or for outputfrom the FSM lattice 30.

In an example, a single FSM lattice 30 is implemented on a singlephysical device, however, in other examples two or more FSM lattices 30can be implemented on a single physical device (e.g., physical chip). Inan example, each FSM lattice 30 can include a distinct data input block52, a distinct output block 54, a distinct programming interface 56, anda distinct set of configurable elements. Moreover, each set ofconfigurable elements can react (e.g., output a high or low signal) todata at their corresponding data input block 52. For example, a firstset of configurable elements corresponding to a first FSM lattice 30 canreact to the data at a first data input block 52 corresponding to thefirst FSM lattice 30. A second set of configurable elementscorresponding to a second FSM lattice 30 can react to a second datainput block 52 corresponding to the second FSM lattice 30. Accordingly,each FSM lattice 30 includes a set of configurable elements, whereindifferent sets of configurable elements can react to different inputdata. Similarly, each FSM lattice 30, and each corresponding set ofconfigurable elements can provide a distinct output. In some examples,an output block 54 from a first FSM lattice 30 can be coupled to aninput block 52 of a second FSM lattice 30, such that input data for thesecond FSM lattice 30 can include the output data from the first FSMlattice 30 in a hierarchical arrangement of a series of FSM lattices 30.

In an example, an image for loading onto the FSM lattice 30 comprises aplurality of bits of data for configuring the configurable elements, theconfigurable switching elements, and the special purpose elements withinthe FSM lattice 30. In an example, the image can be loaded onto the FSMlattice 30 to configure the FSM lattice 30 to provide a desired outputbased on certain inputs. The output block 54 can provide outputs fromthe FSM lattice 30 based on the reaction of the configurable elements todata at the data input block 52. An output from the output block 54 caninclude a single bit indicating a search result of a given pattern, aword comprising a plurality of bits indicating search results andnon-search results to a plurality of patterns, and a state vectorcorresponding to the state of all or certain configurable elements at agiven moment. As described, a number of FSM lattices 30 may be includedin a state machine engine, such as state machine engine 14, to performdata analysis, such as pattern-recognition (e.g., speech recognition,image recognition, etc.) signal processing, imaging, computer vision,cryptography, and others.

FIG. 6 illustrates an example model of a finite state machine (FSM) thatcan be implemented by the FSM lattice 30. The FSM lattice 30 can beconfigured (e.g., programmed) as a physical implementation of a FSM. AFSM can be represented as a diagram 90, (e.g., directed graph,undirected graph, pseudograph), which contains one or more root nodes92. In addition to the root nodes 92, the FSM can be made up of severalstandard nodes 94 and terminal nodes 96 that are connected to the rootnodes 92 and other standard nodes 94 through one or more edges 98. Anode 92, 94, 96 corresponds to a state in the FSM. The edges 98correspond to the transitions between the states.

Each of the nodes 92, 94, 96 can be in either an active or an inactivestate. When in the inactive state, a node 92, 94, 96 does not react(e.g., respond) to input data. When in an active state, a node 92, 94,96 can react to input data. An upstream node 92, 94 can react to theinput data by activating a node 94, 96 that is downstream from the nodewhen the input data matches criteria specified by an edge 98 between theupstream node 92, 94 and the downstream node 94, 96. For example, afirst node 94 that specifies the character ‘b’ will activate a secondnode 94 connected to the first node 94 by an edge 98 when the first node94 is active and the character ‘b’ is received as input data. As usedherein, “upstream” refers to a relationship between one or more nodes,where a first node that is upstream of one or more other nodes (orupstream of itself in the case of a loop or feedback configuration)refers to the situation in which the first node can activate the one ormore other nodes (or can activate itself in the case of a loop).Similarly, “downstream” refers to a relationship where a first node thatis downstream of one or more other nodes (or downstream of itself in thecase of a loop) can be activated by the one or more other nodes (or canbe activated by itself in the case of a loop). Accordingly, the terms“upstream” and “downstream” are used herein to refer to relationshipsbetween one or more nodes, but these terms do not preclude the use ofloops or other non-linear paths among the nodes.

In the diagram 90, the root node 92 can be initially activated and canactivate downstream nodes 94 when the input data matches an edge 98 fromthe root node 92. Nodes 94 can activate nodes 96 when the input datamatches an edge 98 from the node 94. Nodes 94, 96 throughout the diagram90 can be activated in this manner as the input data is received. Aterminal node 96 corresponds to a search result of a sequence ofinterest in the input data. Accordingly, activation of a terminal node96 indicates that a sequence of interest has been received as the inputdata. In the context of the FSM lattice 30 implementing a patternrecognition function, arriving at a terminal node 96 can indicate that aspecific pattern of interest has been detected in the input data.

In an example, each root node 92, standard node 94, and terminal node 96can correspond to a configurable element in the FSM lattice 30. Eachedge 98 can correspond to connections between the configurable elements.Thus, a standard node 94 that transitions to (e.g., has an edge 98connecting to) another standard node 94 or a terminal node 96corresponds to a configurable element that transitions to (e.g.,provides an output to) another configurable element. In some examples,the root node 92 does not have a corresponding configurable element.

As will be appreciated, although the node 92 is described as a root nodeand nodes 96 are described as terminal nodes, there may not necessarilybe a particular “start” or root node and there may not necessarily be aparticular “end” or output node. In other words, any node may be astarting point and any node may provide output.

When the FSM lattice 30 is programmed, each of the configurable elementscan also be in either an active or inactive state. A given configurableelement, when inactive, does not react to the input data at acorresponding data input block 52. An active configurable element canreact to the input data at the data input block 52, and can activate adownstream configurable element when the input data matches the settingof the configurable element. When a configurable element corresponds toa terminal node 96, the configurable element can be coupled to theoutput block 54 to provide an indication of a search result to anexternal device.

An image loaded onto the FSM lattice 30 via the programming interface 56can configure the configurable elements and special purpose elements, aswell as the connections between the configurable elements and specialpurpose elements, such that a desired FSM is implemented through thesequential activation of nodes based on reactions to the data at thedata input block 52. In an example, a configurable element remainsactive for a single data cycle (e.g., a single character, a set ofcharacters, a single clock cycle) and then becomes inactive unlessre-activated by an upstream configurable element.

A terminal node 96 can be considered to store a compressed history ofpast search results. For example, the one or more patterns of input datarequired to reach a terminal node 96 can be represented by theactivation of that terminal node 96. In an example, the output providedby a terminal node 96 is binary, for example, the output indicateswhether a search result for a pattern of interest has been generated ornot. The ratio of terminal nodes 96 to standard nodes 94 in a diagram 90may be quite small. In other words, although there may be a highcomplexity in the FSM, the output of the FSM may be small by comparison.

In an example, the output of the FSM lattice 30 can comprise a statevector. The state vector comprises the state (e.g., activated or notactivated) of configurable elements of the FSM lattice 30. In anotherexample, the state vector can include the state of all or a subset ofthe configurable elements whether or not the configurable elementscorresponds to a terminal node 96. In an example, the state vectorincludes the states for the configurable elements corresponding toterminal nodes 96. Thus, the output can include a collection of theindications provided by all terminal nodes 96 of a diagram 90. The statevector can be represented as a word, where the binary indicationprovided by each terminal node 96 comprises one bit of the word. Thisencoding of the terminal nodes 96 can provide an effective indication ofthe detection state (e.g., whether and what sequences of interest havebeen detected) for the FSM lattice 30.

As mentioned above, the FSM lattice 30 can be programmed to implement apattern recognition function. For example, the FSM lattice 30 can beconfigured to recognize one or more data sequences (e.g., signatures,patterns) in the input data. When a data sequence of interest isrecognized by the FSM lattice 30, an indication of that recognition canbe provided at the output block 54. In an example, the patternrecognition can recognize a string of symbols (e.g., ASCII characters)to, for example, identify malware or other data in network data.

FIG. 7 illustrates an example of hierarchical structure 100, wherein twolevels of FSM lattices 30 are coupled in series and used to analyzedata. Specifically, in the illustrated embodiment, the hierarchicalstructure 100 includes a first FSM lattice 30A and a second FSM lattice30B arranged in series. Each FSM lattice 30 includes a respective datainput block 52 to receive data input, a programming interface block 56to receive configuring signals and an output block 54.

The first FSM lattice 30A is configured to receive input data, forexample, raw data at a data input block. The first FSM lattice 30Areacts to the input data as described above and provides an output at anoutput block. The output from the first FSM lattice 30A is sent to adata input block of the second FSM lattice 30B. The second FSM lattice30B can then react based on the output provided by the first FSM lattice30A and provide a corresponding output signal 102 of the hierarchicalstructure 100. This hierarchical coupling of two FSM lattices 30A and30B in series provides a means to provide data regarding past searchresults in a compressed word from a first FSM lattice 30A to a secondFSM lattice 30B. The data provided can effectively be a summary ofcomplex matches (e.g., sequences of interest) that were recorded by thefirst FSM lattice 30A.

FIG. 7A illustrates a second two-level hierarchy 100 of FSM lattices30A, 30B, 30C, and 30D, which allows the overall FSM 100 (inclusive ofall or some of FSM lattices 30A, 30B, 30C, and 30D) to perform twoindependent levels of analysis of the input data. The first level (e.g.,FSM lattice 30A, FSM lattice 30B, and/or FSM lattice 30C) analyzes thesame data stream, which includes data inputs to the overall FSM 100. Theoutputs of the first level (e.g., FSM lattice 30A, FSM lattice 30B,and/or FSM lattice 30C) become the inputs to the second level, (e.g.,FSM lattice 30D). FSM lattice 30D performs further analysis of thecombination the analysis already performed by the first level (e.g., FSMlattice 30A, FSM lattice 30B, and/or FSM lattice 30C). By connectingmultiple FSM lattices 30A, 30B, and 30C together, increased knowledgeabout the data stream input may be obtained by FSM lattice 30D.

The first level of the hierarchy (implemented by one or more of FSMlattice 30A, FSM lattice 30B, and FSM lattice 30C) can, for example,perform processing directly on a raw data stream. For example, a rawdata stream can be received at an input block 52 of the first level FSMlattices 30A, 30B, and/or 30C and the configurable elements of the firstlevel FSM lattices 30A, 30B, and/or 30C can react to the raw datastream. The second level (implemented by the FSM lattice 30D) of thehierarchy can process the output from the first level. For example, thesecond level FSM lattice 30D receives the output from an output block 54of the first level FSM lattices 30A, 30B, and/or 30C at an input block52 of the second level FSM lattice 30D and the configurable elements ofthe second level FSM lattice 30D can react to the output of the firstlevel FSM lattices 30A, 30B, and/or 30C. Accordingly, in this example,the second level FSM lattice 30D does not receive the raw data stream asan input, but rather receives the indications of search results forpatterns of interest that are generated from the raw data stream asdetermined by one or more of the first level FSM lattices 30A, 30B,and/or 30C. Thus, the second level FSM lattice 30D can implement a FSM100 that recognizes patterns in the output data stream from the one ormore of the first level FSM lattices 30A, 30B, and/or 30C. However, itshould also be appreciated that the second level FSM lattice 30D canadditionally receive the raw data stream as an input, for example, inconjunction with the indications of search results for patterns ofinterest that are generated from the raw data stream as determined byone or more of the first level FSM lattices 30A, 30B, and/or 30C. Itshould be appreciated that the second level FSM lattice 30D may receiveinputs from multiple other FSM lattices in addition to receiving outputfrom the one or more of the first level FSM lattices 30A, 30B, and/or30C. Likewise, the second level FSM lattice 30D may receive inputs fromother devices. The second level FSM lattice 30D may combine thesemultiple inputs to produce outputs. Finally, while only two levels ofFSM lattices 30A, 30B, 30C, and 30D are illustrated, it is envisionedthat additional levels of FSM lattices may be stacked such that thereare, for example, three, four, 10, 100, or more levels of FSM lattices.

FIG. 8 illustrates an example of a method 110 for a compiler to convertsource code into an image used to configure a FSM lattice, such aslattice 30, to implement a FSM. Method 110 includes parsing the sourcecode into a syntax tree (block 112), converting the syntax tree into anautomaton (block 114), optimizing the automaton (block 116), convertingthe automaton into a netlist (block 118), placing the netlist onhardware (block 120), routing the netlist (block 122), and publishingthe resulting image (block 124).

In an example, the compiler 20 includes an application programminginterface (API) that allows software developers to create images forimplementing FSMs on the FSM lattice 30. The compiler 20 providesmethods to convert an input set of regular expressions in the sourcecode into an image that is configured to configure the FSM lattice 30.The compiler 20 can be implemented by instructions for a computer havinga von Neumann architecture. These instructions can cause a processor 12on the computer to implement the functions of the compiler 20. Forexample, the instructions, when executed by the processor 12, can causethe processor 12 to perform actions as described in blocks 112, 114,116, 118, 120, 122, and 124 on source code that is accessible to theprocessor 12.

In an example, the source code describes search strings for identifyingpatterns of symbols within a group of symbols. To describe the searchstrings, the source code can include a plurality of regular expressions(regexes). A regex can be a string for describing a symbol searchpattern. Regexes are widely used in various computer domains, such asprogramming languages, text editors, network security, and others. In anexample, the regular expressions supported by the compiler includecriteria for the analysis of unstructured data. Unstructured data caninclude data that is free form and has no indexing applied to wordswithin the data. Words can include any combination of bytes, printableand non-printable, within the data. In an example, the compiler cansupport multiple different source code languages for implementingregexes including Perl, (e.g., Perl compatible regular expressions(PCRE)), PHP, Java, and .NET languages.

At block 112 the compiler 20 can parse the source code to form anarrangement of relationally connected operators, where different typesof operators correspond to different functions implemented by the sourcecode (e.g., different functions implemented by regexes in the sourcecode). Parsing source code can create a generic representation of thesource code. In an example, the generic representation comprises anencoded representation of the regexes in the source code in the form ofa tree graph known as a syntax tree. The examples described herein referto the arrangement as a syntax tree (also known as an “abstract syntaxtree”) in other examples, however, a concrete syntax tree as part of theabstract syntax tree, a concrete syntax tree in place of the abstractsyntax tree, or other arrangement can be used.

Since, as mentioned above, the compiler 20 can support multiplelanguages of source code, parsing converts the source code, regardlessof the language, into a non-language specific representation, e.g., asyntax tree. Thus, further processing (blocks 114, 116, 118, 120) by thecompiler 20 can work from a common input structure regardless of thelanguage of the source code.

As noted above, the syntax tree includes a plurality of operators thatare relationally connected. A syntax tree can include multiple differenttypes of operators. For example, different operators can correspond todifferent functions implemented by the regexes in the source code.

At block 114, the syntax tree is converted into an automaton. Anautomaton comprises a software model of a FSM which may, for example,comprise a plurality of states. In order to convert the syntax tree intoan automaton, the operators and relationships between the operators inthe syntax tree are converted into states with transitions between thestates. Moreover, in one embodiment, conversion of the automaton isaccomplished based on the hardware of the FSM lattice 30.

In an example, input symbols for the automaton include the symbols ofthe alphabet, the numerals 0-9, and other printable characters. In anexample, the input symbols are represented by the byte values 0 through255 inclusive. In an example, an automaton can be represented as adirected graph where the nodes of the graph correspond to the set ofstates. In an example, a transition from state p to state q on an inputsymbol α, i.e. δ(p, α), is shown by a directed connection from node p tonode q. In an example, a reversal of an automaton produces a newautomaton where each transition p→q on some symbol α is reversed q→p onthe same symbol. In a reversal, start states become final states and thefinal states become start states. In an example, the language recognized(e.g., matched) by an automaton is the set of all possible characterstrings which when input sequentially into the automaton will reach afinal state. Each string in the language recognized by the automatontraces a path from the start state to one or more final states.

At block 116, after the automaton is constructed, the automaton isoptimized to reduce its complexity and size, among other things. Theautomaton can be optimized by combining redundant states.

At block 118, the optimized automaton is converted into a netlist.Converting the automaton into a netlist maps each state of the automatonto a hardware element (e.g., STEs 34, 36, other elements) on the FSMlattice 30, and determines the connections between the hardwareelements.

At block 120, the netlist is placed to select a specific hardwareelement of the target device (e.g., STEs 34, 36, special purposeelements 58) corresponding to each node of the netlist. In an example,placing selects each specific hardware element based on general inputand output constraints for the FSM lattice 30.

At block 122, the placed netlist is routed to determine the settings forthe configurable switching elements (e.g., inter-block switchingelements 40, intra-block switching elements 42, and intra-row switchingelements 44) in order to couple the selected hardware elements togetherto achieve the connections describe by the netlist. In an example, thesettings for the configurable switching elements are determined bydetermining specific conductors of the FSM lattice 30 that will be usedto connect the selected hardware elements, and the settings for theconfigurable switching elements. Routing can take into account morespecific limitations of the connections between the hardware elementsthan can be accounted for via the placement at block 120. Accordingly,routing may adjust the location of some of the hardware elements asdetermined by the global placement in order to make appropriateconnections given the actual limitations of the conductors on the FSMlattice 30.

Once the netlist is placed and routed, the placed and routed netlist canbe converted into a plurality of bits for configuring a FSM lattice 30.The plurality of bits are referred to herein as an image (e.g., binaryimage).

At block 124, an image is published by the compiler 20. The imagecomprises a plurality of bits for configuring specific hardware elementsof the FSM lattice 30. The bits can be loaded onto the FSM lattice 30 toconfigure the state of STEs 34, 36, the special purpose elements 58, andthe configurable switching elements such that the programmed FSM lattice30 implements a FSM having the functionality described by the sourcecode. Placement (block 120) and routing (block 122) can map specifichardware elements at specific locations in the FSM lattice 30 tospecific states in the automaton. Accordingly, the bits in the image canconfigure the specific hardware elements to implement the desiredfunction(s). In an example, the image can be published by saving themachine code to a computer readable medium. In another example, theimage can be published by displaying the image on a display device. Instill another example, the image can be published by sending the imageto another device, such as a configuring device for loading the imageonto the FSM lattice 30. In yet another example, the image can bepublished by loading the image onto a FSM lattice (e.g., the FSM lattice30).

In an example, an image can be loaded onto the FSM lattice 30 by eitherdirectly loading the bit values from the image to the STEs 34, 36 andother hardware elements or by loading the image into one or moreregisters and then writing the bit values from the registers to the STEs34, 36 and other hardware elements. In an example, the hardware elements(e.g., STEs 34, 36, special purpose elements 58, configurable switchingelements 40, 42, 44) of the FSM lattice 30 are memory mapped such that aconfiguring device and/or computer can load the image onto the FSMlattice 30 by writing the image to one or more memory addresses.

Method examples described herein can be machine or computer-implementedat least in part. Some examples can include a computer-readable mediumor machine-readable medium encoded with instructions operable toconfigure an electronic device to perform methods as described in theabove examples. An implementation of such methods can include code, suchas microcode, assembly language code, a higher-level language code, orthe like. Such code can include computer readable instructions forperforming various methods. The code may form portions of computerprogram products. Further, the code may be tangibly stored on one ormore volatile or non-volatile computer-readable media during executionor at other times. These computer-readable media may include, but arenot limited to, hard disks, removable magnetic disks, removable opticaldisks (e.g., compact disks and digital video disks), magnetic cassettes,memory cards or sticks, random access memories (RAMs), read onlymemories (ROMs), and the like.

Referring now to FIG. 9, an embodiment of the state machine engine 14(e.g., a single device on a single chip) is illustrated. As previouslydescribed, the state machine engine 14 is configured to receive datafrom a source, such as the memory 16 over a data bus. In the illustratedembodiment, data may be sent to the state machine engine 14 through abus interface, such as a double data rate three (DDR3) bus interface130. The DDR3 bus interface 130 may be capable of exchanging (e.g.,providing and receiving) data at a rate greater than or equal to 1GByte/sec. Such a data exchange rate may be greater than a rate thatdata is analyzed by the state machine engine 14. As will be appreciated,depending on the source of the data to be analyzed, the bus interface130 may be any suitable bus interface for exchanging data to and from adata source to the state machine engine 14, such as a NAND Flashinterface, peripheral component interconnect (PCI) interface, gigabitmedia independent interface (GMMI), etc. As previously described, thestate machine engine 14 includes one or more FSM lattices 30 configuredto analyze data. Each FSM lattice 30 may be divided into twohalf-lattices. In the illustrated embodiment, each half lattice mayinclude 24K STEs (e.g., STEs 34, 36), such that the lattice 30 includes48K STEs. The lattice 30 may comprise any desirable number of STEs,arranged as previously described with regard to FIGS. 2-5. Further,while only one FSM lattice 30 is illustrated, the state machine engine14 may include multiple FSM lattices 30, as previously described.

Data to be analyzed may be received at the bus interface 130 andprovided to the FSM lattice 30 through a number of buffers and bufferinterfaces. In the illustrated embodiment, the data path includes inputbuffers 132, an instruction buffer 133, process buffers 134, and aninter-rank (IR) bus and process buffer interface 136. The input buffers132 are configured to receive and temporarily store data to be analyzed.In one embodiment, there are two input buffers 132 (input buffer A andinput buffer B). Data may be stored in one of the two data input 132,while data is being emptied from the other input buffer 132, foranalysis by the FSM lattice 30. The bus interface 130 may be configuredto provide data to be analyzed to the input buffers 132 until the inputbuffers 132 are full. After the input buffers 132 are full, the businterface 130 may be configured to be free to be used for other purpose(e.g., to provide other data from a data stream until the input buffers132 are available to receive additional data to be analyzed). In theillustrated embodiment, the input buffers 132 may be 32 KBytes each. Theinstruction buffer 133 is configured to receive instructions from theprocessor 12 via the bus interface 130, such as instructions thatcorrespond to the data to be analyzed and instructions that correspondto configuring the state machine engine 14. The IR bus and processbuffer interface 136 may facilitate providing data to the process buffer134. The IR bus and process buffer interface 136 can be used to ensurethat data is processed by the FSM lattice 30 in order. The IR bus andprocess buffer interface 136 may coordinate the exchange of data, timingdata, packing instructions, etc. such that data is received and analyzedcorrectly. Generally, the IR bus and process buffer interface 136 allowsthe analyzing of multiple data sets in parallel through a logical rankof FSM lattices 30. For example, multiple physical devices (e.g., statemachine engines 14, chips, separate devices) may be arranged in a rankand may provide data to each other via the IR bus and process bufferinterface 136. For purposes of this application the term “rank” refersto a set of state machine engines 14 connected to the same chip select.In the illustrated embodiment, the IR bus and process buffer interface136 may include a 32 bit data bus. In other embodiments, the IR bus andprocess buffer interface 136 may include any suitable data bus, such asa 128 bit data bus.

In the illustrated embodiment, the state machine engine 14 also includesa de-compressor 138 and a compressor 140 to aid in providing statevector data through the state machine engine 14. The compressor 140 andde-compressor 138 work in conjunction such that the state vector datacan be compressed to minimize the data providing times. By compressingthe state vector data, the bus utilization time may be minimized. Thecompressor 140 and de-compressor 138 can also be configured to handlestate vector data of varying burst lengths. By padding compressed statevector data and including an indicator as to when each compressed regionends, the compressor 140 may improve the overall processing speedthrough the state machine engine 14. The compressor 140 may be used tocompress results data after analysis by the FSM lattice 30. Thecompressor 140 and de-compressor 138 may also be used to compress anddecompress configuration data. In one embodiment, the compressor 140 andde-compressor 138 may be disabled (e.g., turned off) such that dataflowing to and/or from the compressor 140 and de-compressor 138 is notmodified.

As previously described, an output of the FSM lattice 30 can comprise astate vector. The state vector comprises the state (e.g., activated ornot activated) of the STEs 34, 36 of the FSM lattice 30 and the dynamic(e.g., current) count of the counter 58. The state machine engine 14includes a state vector system 141 having a state vector cache memory142, a state vector memory buffer 144, a state vector intermediate inputbuffer 146, and a state vector intermediate output buffer 148. The statevector system 141 may be used to store multiple state vectors of the FSMlattice 30 and to provide a state vector to the FSM lattice 30 torestore the FSM lattice 30 to a state corresponding to the providedstate vector. For example, each state vector may be temporarily storedin the state vector cache memory 142. For example, the state of each STE34, 36 may be stored, such that the state may be restored and used infurther analysis at a later time, while freeing the STEs 34, 36 forfurther analysis of a new data set (e.g., search terms). Like a typicalcache, the state vector cache memory 142 allows storage of state vectorsfor quick retrieval and use, here by the FSM lattice 30, for instance.In the illustrated embodiment, the state vector cache memory 142 maystore up to 512 state vectors.

As will be appreciated, the state vector data may be exchanged betweendifferent state machine engines 14 (e.g., chips) in a rank. The statevector data may be exchanged between the different state machine engines14 for various purposes such as: to synchronize the state of the STEs34, 36 of the FSM lattices 30 of the state machine engines 14, toperform the same functions across multiple state machine engines 14, toreproduce results across multiple state machine engines 14, to cascaderesults across multiple state machine engines 14, to store a history ofstates of the STEs 34, 36 used to analyze data that is cascaded throughmultiple state machine engines 14, and so forth. Furthermore, it shouldbe noted that within a state machine engine 14, the state vector datamay be used to quickly configure the STEs 34, 36 of the FSM lattice 30.For example, the state vector data may be used to restore the state ofthe STEs 34, 36 to an initialized state (e.g., to prepare for a newinput data set), or to restore the state of the STEs 34, 36 to priorstate (e.g., to continue searching of an interrupted or “split” inputdata set). In certain embodiments, the state vector data may be providedto the bus interface 130 so that the state vector data may be providedto the processor 12 (e.g., for analysis of the state vector data,reconfiguring the state vector data to apply modifications,reconfiguring the state vector data to improve efficiency of the STEs34, 36, and so forth).

For example, in certain embodiments, the state machine engine 14 mayprovide cached state vector data (e.g., data stored by the state vectorsystem 141) from the FSM lattice 30 to an external device. The externaldevice may receive the state vector data, modify the state vector data,and provide the modified state vector data to the state machine engine14 for configuring the FSM lattice 30. Accordingly, the external devicemay modify the state vector data so that the state machine engine 14 mayskip states (e.g., jump around) as desired.

The state vector cache memory 142 may receive state vector data from anysuitable device. For example, the state vector cache memory 142 mayreceive a state vector from the FSM lattice 30, another FSM lattice 30(e.g., via the IR bus and process buffer interface 136), thede-compressor 138, and so forth. In the illustrated embodiment, thestate vector cache memory 142 may receive state vectors from otherdevices via the state vector memory buffer 144. Furthermore, the statevector cache memory 142 may provide state vector data to any suitabledevice. For example, the state vector cache memory 142 may provide statevector data to the state vector memory buffer 144, the state vectorintermediate input buffer 146, and the state vector intermediate outputbuffer 148.

Additional buffers, such as the state vector memory buffer 144, statevector intermediate input buffer 146, and state vector intermediateoutput buffer 148, may be utilized in conjunction with the state vectorcache memory 142 to accommodate rapid retrieval and storage of statevectors, while processing separate data sets with interleaved packetsthrough the state machine engine 14. In the illustrated embodiment, eachof the state vector memory buffer 144, the state vector intermediateinput buffer 146, and the state vector intermediate output buffer 148may be configured to temporarily store one state vector. The statevector memory buffer 144 may be used to receive state vector data fromany suitable device and to provide state vector data to any suitabledevice. For example, the state vector memory buffer 144 may be used toreceive a state vector from the FSM lattice 30, another FSM lattice 30(e.g., via the IR bus and process buffer interface 136), thede-compressor 138, and the state vector cache memory 142. As anotherexample, the state vector memory buffer 144 may be used to provide statevector data to the IR bus and process buffer interface 136 (e.g., forother FSM lattices 30), the compressor 140, and the state vector cachememory 142.

Likewise, the state vector intermediate input buffer 146 may be used toreceive state vector data from any suitable device and to provide statevector data to any suitable device. For example, the state vectorintermediate input buffer 146 may be used to receive a state vector froman FSM lattice 30 (e.g., via the IR bus and process buffer interface136), the de-compressor 138, and the state vector cache memory 142. Asanother example, the state vector intermediate input buffer 146 may beused to provide a state vector to the FSM lattice 30. Furthermore, thestate vector intermediate output buffer 148 may be used to receive astate vector from any suitable device and to provide a state vector toany suitable device. For example, the state vector intermediate outputbuffer 148 may be used to receive a state vector from the FSM lattice 30and the state vector cache memory 142. As another example, the statevector intermediate output buffer 148 may be used to provide a statevector to an FSM lattice 30 (e.g., via the IR bus and process bufferinterface 136) and the compressor 140.

Once a result of interest is produced by the FSM lattice 30, an eventvector may be stored in a event vector memory 150, whereby, for example,the event vector indicates at least one search result (e.g., detectionof a pattern of interest). The event vector can then be sent to an eventbuffer 152 for transmission over the bus interface 130 to the processor12, for example. As previously described, the results may be compressed.The event vector memory 150 may include two memory elements, memoryelement A and memory element B, each of which contains the resultsobtained by processing the input data in the corresponding input buffers132 (e.g., input buffer A and input buffer B). In one embodiment, eachof the memory elements may be DRAM memory elements or any other suitablestorage devices. In some embodiments, the memory elements may operate asinitial buffers to buffer the event vectors received from the FSMlattice 30, along results bus 151. For example, memory element A mayreceive event vectors, generated by processing the input data from inputbuffer A, along results bus 151 from the FSM lattice 30. Similarly,memory element B may receive event vectors, generated by processing theinput data from input buffer B, along results bus 151 from the FSMlattice 30.

In one embodiment, the event vectors provided to the results memory 150may indicate that a final result has been found by the FSM lattice 30.For example, the event vectors may indicate that an entire pattern hasbeen detected. Alternatively, the event vectors provided to the resultsmemory 150 may indicate, for example, that a particular state of the FSMlattice 30 has been reached. For example, the event vectors provided tothe results memory 150 may indicate that one state (i.e., one portion ofa pattern search) has been reached, so that a next state may beinitiated. In this way, the event vector 150 may store a variety oftypes of results.

In some embodiments, IR bus and process buffer interface 136 may providedata to multiple FSM lattices 30 for analysis. This data may be timemultiplexed. For example, if there are eight FSM lattices 30, data foreach of the eight FSM lattices 30 may be provided to all of eight IR busand process buffer interfaces 136 that correspond to the eight FSMlattices 30. Each of the eight IR bus and process buffer interfaces 136may receive an entire data set to be analyzed. Each of the eight IR busand process buffer interfaces 136 may then select portions of the entiredata set relevant to the FSM lattice 30 associated with the respectiveIR bus and process buffer interface 136. This relevant data for each ofthe eight FSM lattices 30 may then be provided from the respective IRbus and process buffer interfaces 136 to the respective FSM lattice 30associated therewith.

The event vector 150 may operate to correlate each received result witha data input that generated the result. To accomplish this, a respectiveresult indicator may be stored corresponding to, and in someembodiments, in conjunction with, each event vector received from theresults bus 151. In one embodiment, the result indicators may be asingle bit flag. In another embodiment, the result indicators may be amultiple bit flag. If the result indicators may include a multiple bitflag, the bit positions of the flag may indicate, for example, a countof the position of the input data stream that corresponds to the eventvector, the lattice that the event vectors correspond to, a position inset of event vectors, or other identifying information. These resultsindicators may include one or more bits that identify each particularevent vector and allow for proper grouping and transmission of eventvectors, for example, to compressor 140. Moreover, the ability toidentify particular event vectors by their respective results indicatorsmay allow for selective output of desired event vectors from the eventvector memory 150. For example, only particular event vectors generatedby the FSM lattice 30 may be selectively latched as an output. Theseresult indicators may allow for proper grouping and provision ofresults, for example, to compressor 140. Moreover, the ability toidentify particular event vectors by their respective result indicatorsallow for selective output of desired event vectors from the resultmemory 150. Thus, only particular event vectors provided by the FSMlattice 30 may be selectively provided to compressor 140.

Additional registers and buffers may be provided in the state machineengine 14, as well. In one embodiment, for example, a buffer may storeinformation related to more than one process whereas a register maystore information related to a single process. For instance, the statemachine engine 14 may include control and status registers 154. Inaddition, a program buffer system (e.g., restore buffers 156) may beprovided for initializing the FSM lattice 30. For example, initial(e.g., starting) state vector data may be provided from the programbuffer system to the FSM lattice 30 (e.g., via the de-compressor 138).The de-compressor 138 may be used to decompress configuration data(e.g., state vector data, routing switch data, STE 34, 36 states,Boolean function data, counter data, match MUX data) provided to programthe FSM lattice 30.

Similarly, a repair map buffer system (e.g., save buffers 158) may alsobe provided for storage of data (e.g., save maps) for setup and usage.The data stored by the repair map buffer system may include data thatcorresponds to repaired hardware elements, such as data identifyingwhich STEs 34, 36 were repaired. The repair map buffer system mayreceive data via any suitable manner. For example, data may be providedfrom a “fuse map” memory, which provides the mapping of repairs done ona device during final manufacturing testing, to the save buffers 158. Asanother example, the repair map buffer system may include data used tomodify (e.g., customize) a standard programming file so that thestandard programming file may operate in a FSM lattice 30 with arepaired architecture (e.g., bad STEs 34, 36 in a FSM lattice 30 may bebypassed so they are not used). The compressor 140 may be used tocompress data provided to the save buffers 158 from the fuse map memory.As illustrated, the bus interface 130 may be used to provide data to therestore buffers 156 and to provide data from the save buffers 158. Aswill be appreciated, the data provided to the restore buffers 156 and/orprovided from the save buffers 158 may be compressed. In someembodiments, data is provided to the bus interface 130 and/or receivedfrom the bus interface 130 via a device external to the state machineengine 14 (e.g., the processor 12, the memory 16, the compiler 20, andso forth). The device external to the state machine engine 14 may beconfigured to receive data provided from the save buffers 158, to storethe data, to analyze the data, to modify the data, and/or to provide newor modified data to the restore buffers 156.

The state machine engine 14 includes a lattice programming andinstruction control system 159 used to configure (e.g., program) the FSMlattice 30 as well as provide inserted instructions, as will bedescribed in greater detail below. As illustrated, the latticeprogramming and instruction control system 159 may receive data (e.g.,configuration instructions) from the instruction buffer 133.Furthermore, the lattice programming and instruction control system 159may receive data (e.g., configuration data) from the restore buffers156. The lattice programming and instruction control system 159 may usethe configuration instructions and the configuration data to configurethe FSM lattice 30 (e.g., to configure routing switches, STEs 34, 36,Boolean cells, counters, match MUX) and may use the insertedinstructions to correct errors during the operation of the state machineengine 14. The lattice programming and instruction control system 159may also use the de-compressor 138 to de-compress data and thecompressor 140 to compress data (e.g., for data exchanged with therestore buffers 156 and the save buffers 158).

Returning to the FSM lattice 30, it should be noted that FIG. 10illustrates the FSM lattice 30 including similar elements previouslydiscussed with respect to FIG. 5 as well as an additional element, anerror detection engine (EDE) 220. In some embodiments, the EDE 220 mayperform just error detection or the EDE 220 may perform error detectionand correction techniques. It should be understood that although acyclic redundancy check (CRC) is described below as the technique usedfor error detection and correction, the present disclosure encompassesany and all techniques for error detection and correction. For example,it should be understood that the disclosed embodiments may includeparity techniques, error correction code techniques, or the like,instead of or in addition to the CRC techniques described herein. Theparticular functionality and interconnection of these elements in theFSM lattice 30 will be discussed in greater detail with respect to FIG.10.

The FSM lattice 30 in FIG. 10 includes the EDE 220 coupled to theprogramming interface 56, blocks 32, and the output 54. It should benoted that, although the EDE 220 is illustrated as being coupled to asubset of the blocks 32 for simplicity (e.g., top row of blocks 32), inpractice the EDE 220 may be coupled to every block in the FSM lattice30. In addition, although the EDE 220 is shown as part of the FSMlattice 30, in some embodiments, the EDE 220 may be located external tothe FSM lattice 30 (while remaining internal to the state machine engine14). Generally, the EDE 220 validates the configuration data of SymbolResponse Memory (SRM), which may refer to the collective set of memorycells 80 in each state transition elements (STEs) 34, 36 of each GOT 60,as shown in greater detail below. However, it should be appreciatedthat, in some embodiments, the EDE 220 may perform validation of allblocks 32, per each individual block 32, per row 38, per individual GOT60, per STE 34, 36, or some combination thereof. In some instances, oneor more of the memory cells 80 in the blocks 32 of the FSM lattice 30may experience data corruption, bit failure, or the like that causes thestored configuration data to be incorrect. As may be appreciated, forexample, incorrect configuration data, which may be representative of asearch pattern or regular expression to be used for that particular FSMlattice 30, may cause the FSM lattice 30 to produce erroneous results bymissing the desired pattern (known as a false negative result) or byidentifying an incorrect pattern (known as a false positive result) in adata string. Thus, using the disclosed integrity validating techniquesmay enable validating that the configuration data of the SRM isaccurate. It should be noted that the integrity checking techniques maybe performed from as high as the FSM lattice 30 level to as low as theblock 32 level.

For example, in some embodiments, when configuration data (e.g., SRMinformation, such as high (1) or low (0) values) are received at theprogramming interface 56 and stored in the blocks 32, the configurationdata is sent to the EDE 220. In some embodiments, the EDE 220 maycalculate one or more initial CRC values based on the receivedconfiguration data at a first time and store the one or more CRC valuesin a memory, as described further below. In other embodiments, the oneor more CRC values may be generated by the processor 12 and sent withthe configuration data to the programming interface 56, which forwardsthe configuration data and/or CRC values to the EDE 220 for storage ofthe CRC values. Whenever the processor 12 initializes a validation ofthe configuration data of the SRM, the processor 12 may instruct the EDE220 to read the SRM, perform one or more subsequent CRC valuecalculations, and compare the one or more subsequent CRC values to theone or more initial CRC values. If the CRC values are different, thenthe SRM may have been corrupted and the processor 12 may be notified viaa signal output by the EDE 220 using the output 54. The signal mayinclude an alert that the SRM includes incorrect configuration data(e.g., an error), the one or more initial CRC values, identification ofthe block 32 that includes the memory cell 80 with incorrectconfiguration data, and the like. In some embodiments, the EDE 220 maycorrect configuration data using the one or more initial CRC values orreprogram the SRM by sending configuration data to the programminginterface 56.

The processor 12 may perform various corrective actions, such as usingthe one or more initial CRC values to attempt to correct the errors,retransmitting the one or more initial CRC values to the FSM lattice 30and use them to attempt to correct the errors, reprogramming the SRM bysending the configuration data to store in the SRM to the programminginterface 56, or some combination thereof. In some embodiments, when theprocessor 12 reprograms the SRM by sending configuration data (e.g., SRMinformation) to the programming interface 56 and the EDE 220 determinesthat the SRM still contains incorrect data, then the processor 12 mayignore (e.g., disable, leave unused, or the like) the block 32 thatincludes the problematic memory cells 80. Further, based on theinformation output by the EDE 220 indicating that reprogramming did notcorrect the configuration data of the SRM, the processor 12 maydetermine that the issue is related to hardware and display a message tothe same effect.

FIG. 11 illustrates example components of the error detection engine(EDE) 220, according to various embodiments. As depicted, the EDE 220may include a processor 222, and a memory 224. The EDE 220 may be on aseparate chip or included on the same chip as the FSM lattice 30 or theprocessor 12. In some embodiments, the EDE 220 may be implemented ascomputer instructions stored on the memory 224 and executed by theprocessor 222. The memory 224 may be any tangible, non-transitory mediumconfigured to store data (e.g., one or more CRC values), computerinstructions, or the like. For example, the memory 224 may storecomputer instructions that, when executed by the processor 222, causethe processor 222 to calculate CRC values for the SRM configurationdata, store the one or more CRC values, retrieve the one or more CRCvalues, compare initial and subsequent CRC values, and/or output asignal based on the results of the comparison, among other things.

CRC may detect for errors in raw data by calculating an errordetection/correction code for blocks of data entering a system. Forexample, when SRM configuration data is input into the programminginterface 56 from the processor 12, the CRC value may be calculated bythe EDE 220. In some embodiments, as noted above, the processor 12 maycompute the one or more CRC values and send them with the SRMconfiguration data to the programming interface 56. In such an instance,the one or more CRC values may be sent to the EDE 220 via theprogramming interface 56 and the SRM configuration data may not be sentto the EDE 220. In some embodiments, the one or more CRC values may be aremainder of a polynomial division and have a fixed length (e.g., 2, 3,4 bits). Additionally, the one or more CRC values may include a binarysequence. For example, a 3-bit CRC value of “100” may result as theremainder after the EDE 220 performs polynomial division on the SRMconfiguration data when initially input to the SRM. If the processor 12wants to validate the integrity of the SRM configuration data at a latertime, the EDE 220 may retrieve the SRM configuration data and repeat thecalculation of the CRC value. If the subsequently calculated CRC valuedoes not equal “100,” then there may be an error with the SRMconfiguration data. If a difference is detected between the initial oneor more CRC values and the one or more subsequent CRC values, then theEDE 220 may output a signal indicative of the difference to theprocessor 12 via the output 54 of the FSM lattice 30. Additionally oralternatively, if a difference is detected between the initial one ormore CRC values and the one or more subsequent CRC values, the processor222 may attempt to correct the configuration data using the initial CRCvalues, to reprogram the SRM by sending the SRM configuration data tothe programming interface 56, or the like.

To further illustrate some of the data integrity validation embodimentsdisclosed herein, FIG. 12 illustrates an example of a Group of Two (GOT)60 of a row 38 in a block 32 of FIG. 4 including Symbol Response Memory(SRM) 230, according to embodiments. Accordingly, FIG. 12 includessimilar elements previously discussed with respect to FIG. 4 as well asthe EDE 220, an input 232, and a data location 236. As depicted, eachSTE 34, 36 may include a respective SRM 230, and each SRM 230 mayinclude the collective memory cells 80 of the respective STE 34. Forexample, each SRM 230 may include 256 memory cells 80. Also, aspreviously discussed, each memory cell 80 can be set to a high or lowvalue by reading bits from an associated register. Accordingly, the STEs34, 36 can be configured by storing an image created by the compiler 20into the registers and loading the bits in the registers into associatedmemory cells 80. In an example, the image created by the compiler 20includes a binary image of high and low (e.g., 1 and 0) bits, alsoreferred to as SRM configuration data herein. The SRM configuration datamay be received via input 232 from the programming interface 56.

As depicted, the input 232 is connected to each memory cell 80 via dataline 234 so the appropriate value may be stored in each memory cell 80when the SRM configuration data is received from the processor 12. Inaddition, as depicted, the input 232 is connected to the EDE 220 via thedata line 234 so the SRM configuration data may be sent to the EDE 220when received to enable the EDE 220 to calculate the initial one or moreCRC values for the SRM configuration data and/or send the SRMconfiguration data to the programming interface 56. When the EDE 220calculates the initial one or more CRC values, the EDE 220 may calculatethe CRC value for the configuration data of each SRM 230. For example,the configuration data for one SRM 230 in the STE 34 may include abinary sequence of 256 bits and the EDE 220 may calculate acorresponding CRC value of n-bits (e.g., 2-, 3-, 4-, 5-, 6-, 7-, 8-, 9-,10-bit, etc.). Further, in some embodiments, the CRC value may becalculated for the SRM configuration data of both SRMs 230 combined forthe STEs 34, 36. However, in some embodiments, the data provided to theinput 232 may include the one or more CRC values that are calculated bythe processor 12, in addition to the SRM configuration data. In such aninstance, the input 232 may send the SRM configuration data to be storedin the appropriate memory cells 80 and the one or more CRC values to theEDE 220.

The EDE 220 may store the one or more CRC values in the memory 224, aspreviously discussed. It should be understood that there may be numerousCRC values because there may be numerous SRMs 230 in each GOT 60included in each block 32 and one or more CRC value may be calculatedfor the configuration data of each SRM 230. As previously discussed, insome embodiments, there may be one CRC value calculated for all memorycells 80 included in all SRMs 230 of the FSM lattice 30 (e.g., for allblocks 32), one CRC value calculated for a particular block 32, one CRCvalue calculated for a particular GOT 60, one CRC value calculated for aparticular STE 34, 36, or the like.

It should be noted that the data line 234 may be bi-directional in thatthe EDE 220 may request SRM configuration data from the memory cells 80of the SRMs 230 and the memory cells 80 may output its stored values tothe EDE 220 via the data line 234. Thus, data may be sent into thememory cells 80 from the input 232 via the data line 234 and data may beread out of the memory cells 80 by the EDE 220 via the data line 234. Insome embodiments, the EDE 220 may request SRM configuration data fromthe SRMs 230 when the processor 12 issues an instruction to verify theintegrity of the SRM configuration data. The instruction from theprocessor 12 may be received via the input 232 (e.g., from theprogramming interface 56) and sent to the EDE 220. It should be notedthat the input 232 may receive data such as the SRM configuration datathat is used to program the memory cells 80 of the SRMs 230, which isdifferent than the data to be analyzed that is received by the input 52of the FSM lattice 30 and processed by the memory cells 80 via the oneor more selected data stream lines 84.

Upon receipt of the instruction to validate the SRM configuration dataintegrity, the EDE 220 may compute subsequent CRC values by retrievingthe SRM configuration data from the SRMs 230 and compare the initial CRCvalues stored in its memory 224 and the subsequent CRC values todetermine whether there is an error. If an error is detected, the EDE220 may output a signal indicative of the same. If no error is detected,the EDE 220 may output a signal indicative of the same.

In addition, as depicted, the data location 236 is connected to the dataline 234 and, in some embodiments, the integrity validation techniquesperformed by the EDE 220 may be performed on configuration data storedin the data location 236. It should be noted that the data location 236may be located on the same chip but external to the GOTs 60 includingthe SRM 230. That is, the integrity validation techniques may beperformed using configuration data stored separately from the SRM 230.In some embodiments, the data location 236 may include flip-flopregisters on the chip, RAM vectors (e.g., state vector memory buffer144, state vector cache memory 142, state vector intermediate inputbuffer 146, state vector intermediate output buffer 148, event vectormemory 150), or the like. The EDE 220 may perform the validationtechniques disclosed herein on any suitable configuration data stored inthe data location 236.

FIG. 13 illustrates an example of the state machine engine 14 of FIG. 9including the EDE 220, according to various embodiments. Accordingly,FIG. 13 includes many elements similar to those of FIG. 9, as well asthe EDE 220 and a CRC buffer 234 (optional). In the depicted embodiment,the EDE 220 may be located within the state machine engine 14 (e.g., onits own chip or on the same physical chip) and not part of the FSMlattice 30.

As previously discussed, the state machine engine 14 includes thelattice programming and instruction control system 159 used to configure(e.g., program) the FSM lattice 30 as well as provide insertedinstructions. As illustrated, the lattice programming and instructioncontrol system 159 may receive data (e.g., configuration instructions)from the instruction buffer 133. Furthermore, the lattice programmingand instruction control system 159 may receive data (e.g., configurationdata) from the restore buffers 156 and/or the EDE 220. The latticeprogramming and instruction control system 159 may use the configurationinstructions and the configuration data to configure the FSM lattice 30(e.g., to configure routing switches, STEs 34, 36, Boolean cells,counters, match MUX) and may use the inserted instructions to correcterrors during the operation of the state machine engine 14. For example,the processor 12 may send instructions to correct an error in one ormore of the SRMs 230 when the EDE 220 determines that an error ispresent. Additionally or alternatively, the processor 222 of the EDE 220may send the SRM configuration data to the programming and instructioncontrol system 159 without contacting the host 12 when the processor 222detects a difference between one or more initial CRC values and one ormore subsequent CRC values. Another example instruction stored in theinstruction buffer 133 may include an instruction from the processor 12to the state machine engine 14 to validate the integrity of theconfiguration data in the SRMs 230.

As depicted, the programming and instruction control system 159 isconnected to the EDE 220 to provide the SRM configuration data, one ormore initial CRC values associated with the SRM configuration data,and/or the instruction to validate the integrity of the SRMconfiguration data. Thus, anytime the FSM lattice 30 is programmed withSRM configuration data, the programming and instruction control system159 may receive the SRM configuration data and send it to both the EDE220 and the FSM lattice 30. Further, the programming and instructioncontrol system 159 may receive SRM configuration data from the EDE 220.The EDE 220 may receive the SRM configuration data and calculate the oneor more initial CRC values at a first time, as discussed above. Further,the EDE 220 may store the one or more initial CRC values and the SRMconfiguration data in its memory 224. In some embodiments, when the oneor more CRC values are calculated by the processor 12 for the SRMconfiguration data and sent from the programming and instruction controlsystem 159, the EDE 220 may receive the one or more initial CRC valuesand store them in its memory 224.

When the processor 12 issues the instruction to validate the integrityof the SRMs 230, the programming and instruction control system 159sends the instruction to perform the SRM integrity validation to the EDE220. The EDE 220 may request the STE 34 to provide the state (e.g.,configuration data) of the memory cells 80 of each GOT 60 in each datablock 32 included in each FSM lattice 30 at a second time (e.g.,subsequent to the first time). As previously discussed, the state mayinclude either a high or a low value. The STE 34 may send a binarysequence of bits to the EDE 220 that includes 256 bits from each SRM 230in each GOT 60 or the binary sequence of bits may include bits from theentire core of data blocks 32 of the FSM lattice 30. Thus, in someembodiments, the data verification may be performed at the block 32level or the core level. The EDE 220 repeats the CRC value calculationwhen the SRM configuration data is received from the STE 34 to obtainone or more subsequent CRC values.

The EDE 220 performs the SRM data integrity validation by comparing theone or more subsequent CRC values to the one or more initial CRC valuesstored in the memory 224. If any of the CRC values do not match, thenthe EDE 220 output a signal indicating there is an error in the SRMconfiguration data. The signal may include the result that there is anerror, the one or more initial CRC values, the identity of the GOT 60and/or block 32 that includes the erroneous data, and the like. In someembodiments, the EDE 220 may attempt to resolve the error itself byusing the initial one or more CRC values to fix the erroneous SRMconfiguration data and send the corrected SRM configuration data to theprogramming and instruction control system 159 or, alternatively, sendthe originally received SRM configuration data to the programming andinstruction control system 159.

If the CRC values match, then the EDE 220 outputs a result indicatingthat there is not an error in the SRM configuration data. As depicted,the EDE 220 may be connected to the control and status register 154and/or to the CRC buffer 234. In embodiments where the CRC buffer 234 isnot present, the EDE 220 may send the result, initial CRC values, and/orGOT 60 and/or block 32 identity to the control and status register 154.The data may be delivered by the control and status register 154 to theDDR3 bus interface 130, which delivers the result to the processor 12.Additionally or alternatively, the data may be stored in the control andstatus register 154 until the processor 12 reads the data in theregister 154.

In some embodiments, the CRC buffer 224 may be used to store the data(e.g., result, initial CRC values, GOT 60 and/or block 32 identity)output by the EDE 220. The data may be delivered by the CRC buffer 234to the DDR3 bus interface 130, which delivers the result to theprocessor 12. Additionally or alternatively, the data may be stored inthe CRC buffer 234 until the processor 12 reads the data in the register154. If the processor 12 receives a result that indicates there is anerror present in the SRM 230, then the processor 12 may perform one ormore corrective actions, as described in more detail below.

Additionally, in some embodiments, the EDE 220 may validate theintegrity of any suitable configuration data stored in other componentsof the state machine engine 14, such as the data location(s) 236 (e.g.,RAM-based vectors (state vector memory buffer 144, state vector cachememory 142, state vector intermediate input buffer 146, state vectorintermediate output buffer 148, event vector memory 150), flip-flopregisters, and the like), as described above. Thus, it should be bornein mind that, although the discussion of the disclosed integrityvalidation techniques focuses on configuration data stored in the SRM230, embodiments may include performing the techniques using anysuitable component (e.g., data location 236) that stores configurationdata. For example, a routing matrix may be controlled by signals thatoriginate in registers on the chip that are programmed by the hostprocessor 12. These registers may benefit from the use of the disclosedintegrity validation techniques. In another example, in someembodiments, the state vector cache memory 142 may include configurationdata indicative of statuses of the configurable elements (e.g., STEs 34and 36) at any given point in time. The EDE 220 may read theconfiguration data stored in the state vector cache memory 142 andvalidate whether the configuration data is valid or corrupt.Additionally, in some embodiments, the EDE 220 may read theconfiguration data directly from the FSM lattice 30 to determine whetherthe configuration data currently in use by the FSM lattice 30 is validor corrupt.

FIG. 14 illustrates a flow chart of a method 240 for validating theconfiguration data of the Symbol Response Memory (SRM) 230, according tovarious embodiments. Although the following description of the method240 is described with reference to the processor 222 of the EDE 220, itshould be noted that the method 240 may be performed by other processorsthat may be capable of communicating with the EDE 220, such as theprocessor 12. Additionally, although the following method 240 describesa number of operations that may be performed, it should be noted thatthe method 240 may be performed in a variety of suitable orders and allof the operations may not be performed. It should be appreciated thatthe method 240 may be wholly executed by the EDE 220 or the executionmay be distributed between the EDE 220 and the processor 12. In someembodiments, the method 240 may be implemented as computer instructionsstored on the memory 224 and executed by the processor 222. Additionallyor alternatively, the method 240 may partially or wholly implemented inhardware components.

Referring now to the method 240, the processor 222 may receive (block242) SRM configuration data. As previously discussed, the SRMconfiguration data may be received from the programming interface 56 orthe input 232 when the EDE 220 is included in the FSM lattice 30 and theSRM configuration data may be received from the programming andinstruction control system 159 when the EDE 220 is included in thefinite state machine 14. The SRM configuration data may include a binarybit sequence with a high or low value to set each of the memory cells 80in the SRMs 230 of the GOTs 60 included in the data blocks 32. It shouldbe noted that, in some embodiments, the processor 222 of the EDE 220 mayreceive the one or more initial CRC values instead of or in addition toreceiving the SRM configuration data.

The processor 222 may calculate (block 244) one or more initial CRCvalues based on the received SRM configuration data in embodiments wherethe EDE 220 just receives the SRM configuration data. As previouslydiscussed, the processor 222 may perform polynomial division on the SRMconfiguration data (e.g., binary bit sequence) to obtain the one or moreinitial CRC values based on the remainder. The processor 222 may store(block 246) the one or more initial CRC values in the memory 224 to becompared against later. At any time during operation, the host processor12 may desire to validate the configuration data stored in the memorycells 80 of the SRM 230. Accordingly, the host processor 12 may issue aninstruction to the EDE 220 to validate the integrity of theconfiguration data of the SRM 230. The processor 222 may receive (block248) the instruction and calculate (block 250) one or more subsequentCRC values.

In embodiments where the EDE 220 is part of the FSM lattice 30, the EDE220 may directly read the memory cells 80 of each of the GOTs 60 of theblocks 32 to retrieve the SRM configuration data. In embodiments wherethe EDE 220 is not part of the FSM lattice 30, the EDE 220 may retrievethe SRM configuration data from one or more vectors (e.g., the statevector memory buffer 144, state vector cache memory 142, the statevector intermediate input buffer 146, the state vector intermediateoutput buffer 148, and/or the event vector memory 150). Once theprocessor 222 retrieves the SRM configuration data, the processor 222may repeat the CRC value calculation on the retrieved SRM configurationdata to obtain the one or more subsequent CRC values. Next, theprocessor 222 may retrieve the one or more initial CRC values from thememory 224 and compare (block 252) the one or more initial CRC valuesand the one or more subsequent CRC values.

If there is a difference between the one or more initial CRC values andthe one or more subsequent CRC values, the processor 222 may perform(block 254) a corrective action. For example, the processor may output asignal that includes information (e.g., one or more initial CRC values,identity of the memory cell 80, the GOT 60, and/or the block 32 thatincludes the erroneous SRM configuration data, etc.) to the hostprocessor 12. The host processor 12 may receive the signal and determinean appropriate action to take to attempt to correct the error. Forexample, the host processor 12 may use the one or more initial CRCvalues received from the EDE 220 to attempt to correct the error. Insome embodiments, the processor 12 may modify SRM configuration datausing the one or more initial CRC values (e.g., multiplying the SRMconfiguration data by the CRC value) to attempt to fix SRM configurationdata in the one or more blocks 32 that include erroneous configurationdata. In another example, when the host processor 12 calculates the oneor more initial CRC values, the processor 12 may retransmit the initialCRC values and use them to attempt to correct the errors. Further, insome embodiments, the host processor 12 may reprogram the SRMs 230 byretransmitting the SRM configuration data to the programming interface56 and/or the programming and instruction control system 159. After theSRMs 230 are reprogrammed, the integrity validation techniques may beperformed again. If the SRM configuration data for certain blocks 32 isstill erroneous, then the processor 12 may ignore those blocks 32 duringoperation. In such a scenario, the processor 12 may cause an alert to besent or displayed that indicates that reprogramming was not successfuland that there is a potential hardware issue.

In some embodiments, when the EDE 220 is disposed in the FSM lattice 30and an error in the SRM configuration data is detected, the EDE 220 maydirectly write to the memory cells 80 of each of the GOTs 60 of theblocks 32 that include errors to reprogram the memory cells 80 with theoriginal SRM configuration data without contacting the host processor12. In some embodiments, the EDE 220 may directly reprogram all of thememory cells 80 with the original SRM configuration data (e.g., bymultiplying the SRM configuration data by the initial CRC value) withoutcontacting the host processor 12. If the EDE 220 performs a subsequentSRM configuration data validity check and determines that the initialand subsequent one or more CRC values match, then the EDE 220 will bedeemed to have fixed the SRM configuration data error(s) and the statemachine 14 may continue to process with the current SRM configurationdata. However, in some embodiments, if a subsequent error is detected inthe SRM configuration data after reprogramming the memory cells 80, thenthe EDE 220 may notify the host processor 12 of the failure to fixcertain memory cells 80 and instruct the host processor 12 to ignore thefaulty memory cells 80. Alternatively, if a subsequent error is detectedin the SRM configuration data after reprogramming the memory cells 80,then the EDE 220 may output a signal to the host processor 12 asdescribed above, and the processor 12 may perform a corrective action.

For example, the host processor 12 may attempt to fix the SRMconfiguration data as described above. If the host processor 12 performsa corrective action and a subsequent SRM configuration data validitycheck by the EDE 220 indicates the configuration data is accurate (e.g.,the one or more initial and subsequent CRC values match), then the statemachine 14 may continue to process with the current SRM configurationdata. However, if a subsequent error is detected in the SRMconfiguration data after the host processor 12 performs the correctiveaction, then the processor 12 may ignore those blocks 32 that containthe faulty SRM configuration data during operation.

In some embodiments, when the EDE 220 is not included in the FSM lattice30 (for example, when the EDE 220 is external to the FSM 30 asillustrated in FIG. 13) and an error in the configuration data isdetected, the EDE 220 may send the original SRM configuration data tothe programming and instruction control system 159 to attempt to fix theerroneous data without contacting the host processor 12. The programmingand instruction control system 159 may send the SRM configuration datato the FSM lattice 30 to reprogram the problematic memory cells 80 orreprogram all memory cells 80. If the EDE 220 performs a subsequent SRMconfiguration data validity check and determines that the initial andsubsequent one or more CRC values match, then the SRM configuration dataerror is deemed to be fixed, and the state machine 14 may continue toprocess with the current SRM configuration data. However, in someembodiments, if a subsequent error is detected in the SRM configurationdata after reprogramming the memory cells 80, then the EDE 220 maynotify the host processor 12 of the failure to fix certain memory cells80 and instruct the host processor 12 to ignore the faulty memory cells80. Alternatively, if a subsequent error is detected in the SRMconfiguration data after reprogramming the memory cells 80, then the EDE220 may output a signal to the host processor 12 as described above, andthe processor 12 may perform a corrective action similar to thatdescribed above in conjunction with the embodiment in which the EDE 220is disposed in the FSM lattice 30.

While the invention may be susceptible to various modifications andalternative forms, specific embodiments have been shown by way ofexample in the drawings and have been described in detail herein.However, it should be understood that the invention is not intended tobe limited to the particular forms disclosed. Rather, the invention isto cover all modifications, equivalents, and alternatives falling withinthe spirit and scope of the invention as defined by the followingappended claims.

1. A device, comprising: a plurality of blocks, each block of theplurality of blocks comprising a plurality of rows, each row of theplurality of rows comprising a plurality of configurable elements, eachconfigurable element of the plurality of configurable elementscomprising a data analysis element comprising a memory componentprogrammed with configuration data, wherein the data analysis element isconfigured to analyze at least a portion of a data stream based on theconfiguration data and to output a result of the analysis; and an errordetection engine (EDE) configured to perform integrity validation of theconfiguration data.
 2. The device of claim 1, wherein the EDE isconfigured to perform integrity validation of the configuration data atleast partially by performing one or more cyclic redundancy checks(CRC).
 3. The device of claim 2, wherein the EDE is configured toperform the one or more CRCs at least partially by: receiving theconfiguration data from a host processor each time the host processorprograms the memory component of the data analysis element included ineach of the plurality of configurable elements; calculating one or moreinitial CRC values based on the configuration data; and storing the oneor more initial CRC values in a memory of the CRC engine.
 4. The deviceof claim 2, wherein the EDE is configured to perform the one or moreCRCs at least partially by: receiving one or more initial CRC valuescalculated by a host processor based on the configuration data each timethe host processor programs the memory component of the data analysiselement included in each of the plurality of configurable elements; andstoring the one or more initial CRC values in a memory of the CRCengine.
 5. The device of claim 4, wherein the EDE is configured toperform the one or more CRCs at least partially by: receiving aninstruction to perform the one or more CRCs from the host processor. 6.The device of claim 5, wherein the EDE is configured to perform the oneor more CRCs at least partially by: retrieving the one or more initialCRC values; retrieving the configuration data stored in the memorycomponent of the data analysis element included in each of the pluralityof configurable elements; calculating one or more subsequent CRC valuesbased on the retrieved configuration data; comparing the one or moresubsequent CRC values to the one or more initial CRC values; andoutputting a signal to the host processor when the one or moresubsequent CRC values differ from the one or more initial CRC values. 7.The device of claim 6, wherein the EDE is configured to retrieve theconfiguration data by requesting the configuration data from a symbolresponse memory (SRM).
 8. The device of claim 6, wherein the EDE isconfigured to retrieve the configuration data by reading theconfiguration data directly from the memory component.
 9. The device ofclaim 6, wherein the host processor, based on the signal, is configuredto reprogram the memory component of the data analysis element of eachof the plurality of configuration elements with the configuration data.10. The device of claim 1, wherein the EDE is configured to perform theintegrity validation at the block level, at a core level including theplurality of blocks, or both.
 11. (canceled)
 11. A device, comprising: astate machine engine comprising: a plurality of blocks, each block ofthe plurality of blocks comprising: a plurality of rows, each row of theplurality of rows comprising: a plurality of configurable elements, eachconfigurable element of the plurality of configurable elementsconfigured to be programmed via configuration data to analyze at least aportion of a data stream and to selectively output the result of theanalysis; and one or more data locations storing the configuration data;and an error detection engine (EDE) configured to validate the integrityof the configuration data of the one or more data locations.
 12. Thedevice of claim 11, wherein the state machine engine includes a finitestate machine lattice comprising the plurality of blocks and the EDE.13. The device of claim 12, wherein the device comprises a hostprocessor and the finite state machine lattice comprises a programminginterface that is configured to: receive the configuration data from thehost processor; program each of the plurality of configurable elementswith the configuration data; and send the configuration data to the EDEto calculate one or more initial cyclic redundancy check (CRC) valuesbased on the configuration data each time the configuration data isreceived from the host processor.
 14. The device of claim 11, whereinthe EDE is configured to validate the integrity of the configurationdata at least partially by performing a cyclic redundancy check (CRC),wherein performing the CRC comprises: receiving the configuration datafrom a host processor of the device each time the host processorprograms each of the plurality of configurable elements; calculating oneor more initial CRC values based on the configuration data; receiving aninstruction from the host processor to validate the integrity of theconfiguration data; calculating one or more subsequent CRC values basedon the configuration data retrieved at a later time; and determiningwhether the one or more initial CRC values differ from the one or moresubsequent CRC values.
 15. The device of claim 14, wherein the EDE isconfigured to output a signal indicative of an error in theconfiguration data to the host processor when the one or more initialCRC values differ from the one or more subsequent CRC values.
 16. Thedevice of claim 15, wherein the host processor is configured toreprogram each of the plurality of configurable elements based on thesignal.
 17. The device of claim 11, wherein the EDE is configured tovalidate the integrity of the configuration data at least partially by:receiving one or more initial cyclic redundancy check (CRC) values froma host processor of the device; receiving an instruction from the hostprocessor to validate the integrity of the configuration data;calculating one or more subsequent CRC values based on the configurationdata retrieved at a later time; and determining whether the one or moreinitial CRC values differs from the one or more subsequent CRC values.18. The device of claim 11, wherein the EDE is configured to validatethe integrity of the configuration data at least partially bydetermining whether an initial cyclic redundancy check (CRC) valuegenerated based on the configuration data at a first time differs from asubsequent CRC value generated at a second time.
 19. A device,comprising: a finite state machine lattice comprising: a plurality ofblocks, each block of the plurality of blocks comprising: a plurality ofrows, each row of the plurality of rows comprising: a plurality ofconfigurable elements, each configurable element of the plurality ofconfigurable elements comprising a symbol response memory (SRM) thatstores configuration data used to analyze at least a portion of a datastream and to selectively output the result of the analysis; and anerror detection engine (EDE) configured to validate the integrity of theconfiguration data at least partially by determining whether an initialcyclic redundancy check (CRC) value generated based on the configurationdata at a first time differs from a subsequent CRC value generated at asecond time.
 20. The device of claim 19, wherein the EDE is configuredto output a signal indicative of an error to a host processor of thedevice when the initial CRC value differs from the subsequent CRC value.21. The device of claim 20, wherein the host processor is configured toreprogram each of the plurality of configurable elements based on thesignal.
 22. A method, comprising: calculating one or more initial cyclicredundancy check (CRC) values at a first time based on configurationdata stored in one or more memory components included in a state machineengine used to analyze at least a portion of a data stream and toselectively output the result of the analysis; receiving an instructionto validate the configuration data stored in the one or more memorycomponents; calculating one or more subsequent CRC values at a secondtime based on the configuration data stored in the one or more memorycomponents of the state machine engine used to analyze at least theportion of the data stream; determining whether the one or moresubsequent CRC values differ from the one or more initial CRC values;and performing a corrective action when the one or more subsequent CRCvalues differ from the one or more initial CRC values.
 23. The method ofclaim 22, wherein performing the corrective action comprises altering atleast one of a plurality of memory cells included in a symbol responsememory (SRM), wherein at least one of the one or more memory componentscomprises the SRM.
 24. The method of claim 22, comprising reading theconfiguration data from each memory cell included in the one or morememory components, reading the configuration data from a vector includedin the one or more memory components, or reading the configuration datafrom a register included in the one or more memory components at thesecond time.
 25. The device of claim 1, wherein the memory componentcomprises a symbol response memory (SRM) including a plurality of memorycells that each store a high value or a low value based on theconfiguration data.